Call for Participation
3d WORKSHOP ON FAULT DIAGNOSIS AND TOLERANCE
IN CRYPTOGRAPHY - FDTC 2006
Yokohama, Japan - Tuesday October 10, 2006
(one day prior to CHES 2006 – same location)
in Association with CHES 2006:
WORKSHOP ON CRYPTOGRAPHIC HARDWARE IN EMBEDDED SYSTEMS
In recent years applied cryptography has developed considerably, to satisfy the increasing security requirements of various information technology disciplines, e.g., telecommunications, networking, data base systems and mobile applications.
Cryptosystems are inherently computationally complex and in order to satisfy the high throughput requirements of many applications, they are often implemented by means of either VLSI devices (crypto-accelerators) or highly optimized software routines (crypto-libraries) and are used via suitable (network) protocols.
The high complexity of such implementations raises concerns regarding their reliability. Research is therefore needed to develop methodologies and techniques for designing robust cryptographic systems (both hardware and software), and to protect them against both accidental faults and intentional intrusions and attacks, in particular those based on the malicious injection of faults into the device for the purpose of extracting the secret key.
This year’s workshop will feature two invited talks:
Raphael Bauduin (EDSI) "Fault Attacks, an Intuitive Approach"
Bruno Robisson (CEA) “Safe Design Methodologies against Fault Attacks”
Contributions to the workshop describing theoretical studies and practical case studies of fault diagnosis and tolerance in cryptographic systems (HW and SW) and protocols are solicited. Topics of interest include, but are not limited to:
· Modelling the reliability of cryptographic systems and protocols.
· Inherently reliable cryptographic systems and algorithms.
· Faults and fault models for cryptographic devices (HW and SW).
· Reliability-based attack procedures on cryptographic systems (fault-injection based attacks) and protocols.
· Adapting classical fault diagnosis and tolerance techniques to cryptographic systems.
· Novel fault diagnosis and tolerance techniques for cryptographic systems.
· Case studies of attacks, reliability and fault diagnosis and tolerance techniques in cryptographic systems.
· Submission deadline: May 1, 2006 – CLOSED
· Notification deadline: June 10, 2006 – CLOSED
· Final paper deadline: July 20, 2006 – CLOSED
· Submissions: extended abstracts of 10 pages or less, PDF format is preferred.
Please provide name, affiliation, telephone, fax number and email address.
Final papers will have to be formatted according to the LNCS format instructions.
Bao Feng I2R
Luca Breveglieri Politecnico di Milano
Ernie Brickell Intel
Hervé Chabannes Sagem Défense Sécurité
Christophe Clavier Gemplus
Wieland Fischer Infineon
Christophe Giraud Oberthur
Shay Gueron U Haifa, and Intel Corp.
Louis Goubin U de Versailles
Mohaned Kafi Axalto
Ramesh Karri Brooklyn Poly
Jong Rok Kim Samsung
Vanessa Gratzer U Paris 2 Panthéon Assas
Cetin Kaya Koç Oregon State U
Israel Koren U of Mass. at Amherst
Pierre-Yvan Liardet STMicroelectronics
Wenbo Mao HP
Sandra Marcello Thalès
Elisabeth Oswald Graz U of Technology
Elena Trichina Spansion
Michael Tunstall Royal Holloway U London
Wen-Guey Tzeng National Chiao Tung U
Claire Whelan Dublin City U
Kaiji Wu U of Illinois at Chicago
Moti Yung Columbia U
Organizers and workshop series founders:
Prof. Luca Breveglieri
* Dept. of Electronic and Information Sciences
Politecnico di Milano, Piazza Leonardo Da Vinci n. 32, I-20133, Milano, ITALY
( + 39 (0)2 2399 3653
7 + 39 (0)2 2399 3411
Prof. Israel Koren
* Dep. of Electrical & Computer Engineering
University of Massachusetts
Amherst, MA 01003, USA
( + 01 (413) 545-2643
7 + 01 (413) 545-1993
Scientific Program co-Chairs for the 2006 workshop:
Prof. David Naccache
* Ecole Normale Supérieure,
Equipe de Cryptographie, 45 rue d’Ulm,
F-75005, Paris, France
( + 33 6 11 56 69 05
Dr. Jean-Pierre Seifert
* Applied Security Research Group
Center for Comp. Mathematics and Sci. Comp.
Faculty of Science and Science Education
University of Haifa
Haifa 31905, Israel
( + 1 (503) 608 7347
Local conference organisers:
Dr. Yukiyasu Tsunoo - NEC
Dr. Tetsuya Izu - Fujitsu
Dr. Natsume Matsuzaki - Panasonic
Dr. Akashi Satoh - IBM